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dilek milyar Ülke çapında gabor gyepes sram reliability Ele almak Mucizevi Nüfuz etmek

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF
Application of IDDT test towards increasing SRAM reliability in nanometer technologies | Request PDF

An embedded IDDQ testing circuit and technique | Semantic Scholar
An embedded IDDQ testing circuit and technique | Semantic Scholar

INSTITUTE OF ELECTRONICS AND PHOTONICS
INSTITUTE OF ELECTRONICS AND PHOTONICS

PDF) Detection of Faults in SRAM Using Transient Current Testing | IOSR Journals - Academia.edu
PDF) Detection of Faults in SRAM Using Transient Current Testing | IOSR Journals - Academia.edu

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar

PDF) IOSR journal of VLSI and Signal Processing | IOSR Journals - Academia.edu
PDF) IOSR journal of VLSI and Signal Processing | IOSR Journals - Academia.edu

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

PDF) Dynamic power supply current test for CMOS SRAM
PDF) Dynamic power supply current test for CMOS SRAM

Fault detection as a function of the cycle time, defect size and number... | Download Scientific Diagram
Fault detection as a function of the cycle time, defect size and number... | Download Scientific Diagram

IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT
IMPLEMENTATION OF BIST ARCHITECTURE FOR TESTING SRAM CELL USING DYNAMIC SUPPLY CURRENT

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar
PDF] APPLICATION OF I DDT TEST IN SRAM ARRAYS TOWARDS EFFICIENT DETECTION OF WEAK OPENS | Semantic Scholar

Waveforms of simulations (defect 2) | Download Scientific Diagram
Waveforms of simulations (defect 2) | Download Scientific Diagram

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

Defect positions of 1-bit ripple carry adder | Download Scientific Diagram
Defect positions of 1-bit ripple carry adder | Download Scientific Diagram

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

PDF) Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies
PDF) Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies

Waveforms of simulations (defect 4) | Download Scientific Diagram
Waveforms of simulations (defect 4) | Download Scientific Diagram

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

IEEE Paper Template in A4 (V1)
IEEE Paper Template in A4 (V1)

dblp: Gábor Gyepes
dblp: Gábor Gyepes